top of page
background.png

MateriX

Where materials

tell the truth.

Your strategic partner for

advanced materials characterization and failure analysis for semiconductor, battery, electronics, and advanced materials industries.

Why MateriX

  • More Than a Service 

  • Long-term Strategic Partner

  • Invested in Your Progress

Rapid turnaround 

Confidential and Secure Sample Handling

High-resolution analysis for high-stakes decisions

Efficient, Competitive Pricing

Work directly with the engineers performing your analysis—no intermediaries, no delays.

AN0369-R3_04.tif
materix logo2222_edited.png

Industries

Semiconductor

Precise imaging and analysis to support process development, defect review, contamination checks, and device reliability.

Battery & Energy

Failure insight, material validation, and advanced characterization for silicon anodes, electrodes, and next-generation energy systems.

Advanced Materials & Electronics

Support for coatings, interfaces, morphology, elemental composition, and performance-driven material development.

Consultation

Every technical challenge is different. Connect with us for a complimentary consultation, and let’s discuss the most effective analytical approach for your goals.

CA0337-R0_C_954_R_XS_10.tif
CA0337-R0_C_954_R_XS_10.tif
materix logo2222_edited.png

Analytical Tools to Support top-tier Metrology 

Advanced Microscopy, Stereoscopy, Spectroscopy, and Chemical Analysis*

Field Emission Scanning Electron Microscope (FE-SEM) with Energy Dispersive X-ray Spectroscopy (EDS / EDX)

  • High-resolution surface and cross-sectional imaging

  • Defect and contamination inspection

Surface Area & Porosity Analysis

  • BET Surface Area Analyzer

  • Specific surface area measurement

  • Pore volume and pore size distribution analysis

  • Adsorption/desorption characterization

Dynamic Light Scattering (DLS) Particle Size Analysis

  • Zeta potential measurement

  • Particle size distribution analysis

  • Nanoparticle dispersion stability assessment

  • Colloidal system characterization

ICP-OES (Inductively Coupled Plasma Optical Emission Spectroscopy)

  • Elemental composition analysis

  • ​Impurity and contamination investigations

X-ray Diffraction (XRD)

  • Phase identification

  • Crystallinity and structural characterization

  • Material phase verification

Sample Preparation & Failure Analysis

  • Precision cutting / mounting / polishing

  • Root cause investigation

  • Contamination source analysis

Connect with Us for a Complimentary Consultation

Need a specialized technique, custom workflow, or additional instrumentation?

* Listed instrumentation represents only part of our broader analytical capabilities.

Materials Characterization Scientist

Apply advanced characterization techniques to investigate material behavior, defects, failure mechanisms, and process challenges while delivering actionable technical insight to customers.

Lab Technician / Metrology Specialist

Operate advanced analytical equipment, prepare samples, and support high-quality metrology workflows that enable accurate, timely insight for customer projects.

bottom of page